Your goal is to develop a thin-film characterization platform targeted to analyze various thin-film phenomena and solve most challenging puzzles originating form growth and application of thin-film devises, including:
• Hybrid thin-film characterization schemes based on an efficient combination of various measurement techniques;
• Improvement of the accuracy of both measurements and data analysis and the uniqueness of current X-ray measurements;
• Assisting and teaching of thin-film metrology to colleagues and students in the group.
You have a PhD degree in physics, materials science, physical chemistry or engineering, related to characterization of nano-structures and nano-metrology.
• You have evidenced experience in X-ray analysis of thin films and interfaces.
• You have affinity with the development of new or extension of existing characterization techniques.
• You have confirmed experience with scientific data analysis. Advanced knowledge of statistical methods for data analysis is an advantage.
• You are an excellent team player in an enthusiastic group of scientists and engineers working on a common theme.
• You are creative, like to push boundaries, and are highly motivated to address a major science challenge in thin film metrology.
• You are fluent in English and able to collaborate intensively with industrial and academic parties in regular meetings and work visits.
You will be appointed on a fulltime position for two years, with possible extension. The university offers a dynamic ecosystem with enthusiastic colleagues in a stimulating scientific environment. The post-doc salary is between € 3.353,- and € 4.402,- gross per month depending on experience and qualifications.
The offer further involves: a holiday allowance of 8% of the gross annual salary and a year-end bonus of 8.3%, a solid pension scheme, a minimum of 29 holidays, and numerous professional and personal development programmes.